|
Document |
Type |
Description |
 |
ACA350-01 |
Drawing |
Schematic
and assembly diagram for the CA350 type FLASH cable (C710) |
|
|
FSP-C700-001
(obsolete) |
Field
Service
Procedure |
Outlines the steps
needed to field update the FLASH memory on the C700 type plug-in CPU. |
|
|
FSP-C710-001 |
Field
Service
Procedure |
Outlines the steps
needed to field update the FLASH memory on the C710 type plug-in CPU. |
|
|
RouteWarePRO
Version 2.4 |
Operations
Manual |
Installation and
operations manual |
|
|
OP-10942B |
Operations
Manual |
Installation and
operations manual |
|
|
OP-S2560D |
Operations
Manual |
Installation and
operations manual |
|
|
Programmers Guide
for USC Products |
Link |
Programmers
Guide: Interface
Control Protocol and General User Guide |
|
|
The VXI Platform |
Reference |
Discussion about VXI today, and the
future.
Prepared
by the VXI Consortium |
|
|
70000 & RS70000 |
Reference |
Operations
manual for the rugged relays 70000 and RS70000 Series |
|
|
US Freq Allocation
Chart 2003 |
Reference |
United States
Frequency Allocation Chart (The Radio Spectrum) Version 2003 |
| |
|
|
|
 |
Save Money by
Buying More Equipment |
Reference:
Switching Article |
Automated switching in ATE
applications helps to create an environment in which test results are
repeatable with fewer errors and less human involvement. Throughput
generally increases, and test personnel become more productive. Overall,
investing in automated switching easily can be shown to save money.
(Evaluation Engineering, Nov. 2005) |
|
|
Test System Switching |
Reference:
Switching Article |
Advice on
how to choose the right relay and associated switching architecture is
offered in this article. Capacitance, inductance, resistance, current,
voltage, grounding, guarding, cost, and expandability need to be considered.
Relay types include FET, reed, armature, RF and microwave relays.
(Evaluation Engineering: Feb. 2005) |
|
|
Selecting One or
More From N |
Reference:
Switching Article |
Although ATE systems generally
include signal and power switching, different types of signals require a
wide variety of switching modules. This article contains a comparison chart
listing the specifications of many diverse switching solutions. (Evaluation
Engineering: Nov. 2004) |
|
|
Switching Considerations for Microwave Test Systems |
Reference:
Switching Article |
Repeatable
manufacturing based on computer-aided designs is key to predictable RF
switch performance. Design considerations such as VSWR and insertion loss
are covered in this article along with typical switch configurations.
(Evaluation Engineering: April 2004) |
|
|
How to Reduce
Noise in Test-System Switches |
Reference:
Switching Article |
With the advent of
higher-speed logic in devices combined with sensitive analog circuits, it is
more difficult and more crucial to reduce noise and maintain signal
integrity in test switching systems. Guidelines are presented in this
article to reduce noise in test-system switches. (Evaluation Engineering:
Nov. 2003) |
