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Downloads
Data Sheets, Applications Notes, Technical Papers, and Documents

Document		Type	Description
	ACA350-01	Drawing	Schematic and assembly diagram for the CA350 type FLASH cable (C710)
	FSP-C700-001 (obsolete)	Field Service Procedure	Outlines the steps needed to field update the FLASH memory on the C700 type plug-in CPU.
	FSP-C710-001	Field Service Procedure	Outlines the steps needed to field update the FLASH memory on the C710 type plug-in CPU.
	RouteWarePRO Version 2.4	Operations Manual	Installation and operations manual
	OP-10942B	Operations Manual	Installation and operations manual
	OP-S2560D	Operations Manual	Installation and operations manual
	USC Control Protocol (Rev D)	Reference	Interface Control Protocol
	The VXI Platform	Reference	Discussion about VXI today, and the future. Prepared by the VXI Consortium
	US Freq Allocation Chart 2003	Reference	United States Frequency Allocation Chart (The Radio Spectrum) Version 2003
	Save Money by Buying More Equipment	Reference: Switching  Article	Automated switching in ATE applications helps to create an environment in which test results are repeatable with fewer errors and less human involvement. Throughput generally increases, and test personnel become more productive. Overall, investing in automated switching easily can be shown to save money. (Evaluation Engineering, Nov. 2005)
	Test System Switching	Reference: Switching  Article	Advice on how to choose the right relay and associated switching architecture is offered in this article. Capacitance, inductance, resistance, current, voltage, grounding, guarding, cost, and expandability need to be considered. Relay types include FET, reed, armature, RF and microwave relays. (Evaluation Engineering: Feb. 2005)
	Selecting One or More From N	Reference: Switching  Article	Although ATE systems generally include signal and power switching, different types of signals require a wide variety of switching modules. This article contains a comparison chart listing the specifications of many diverse switching solutions. (Evaluation Engineering: Nov. 2004)
	Switching Considerations for Microwave Test Systems	Reference: Switching  Article	Repeatable manufacturing based on computer-aided designs is key to predictable RF switch performance. Design considerations such as VSWR and insertion loss are covered in this article along with typical switch configurations. (Evaluation Engineering: April 2004)
	How to Reduce Noise in Test-System Switches	Reference: Switching  Article	With the advent of higher-speed logic in devices combined with sensitive analog circuits, it is more difficult and more crucial to reduce noise and maintain signal integrity in test switching systems. Guidelines are presented in this article to reduce noise in test-system switches. (Evaluation Engineering: Nov. 2003)